Materials Development Corporation (MDC) designs, develops, and manufactures measurement equipment for the semiconductor industry. These measurements help the semiconductor manufacturer monitor critical processing steps for contamination and material quality. MDC test equipment is used worldwide by almost every semiconductor manufacturer.
MDC offers a complete line of measurement systems, software, and services for monitoring semiconductor processing. Measurements include Capacitance vs. Voltage (C-V), Conductance vs. Voltage (G-V), Current vs. Voltage (I-V), Gate Oxide Integrity (GOI), Doping Profiling (N-W), Interface Trap Density (Dit), Dielectric Constant, Solar Cell Tests, and Thin Film Transistor (TFT) measurements.
MDC Systems include a wide range of capacitance and current meters. Measurement frequencies range from 20 Hz to 10 MHz, and bias voltages extend up to 1100 volts.
A complete line of probe stations is also available. Selections include Mercury Probes, Hot Chuck Systems, Cryogenic Probe Stations, and Fully Automatic Autoloading Systems with SMIF integration.
The CSM/Win Semiconductor Measurement Systems developed by MDC include a wide selection of instruments and probe stations combined with the latest CSM/Win Windows-based custom software.
Behind all CSM/Win Systems stands MDC, the company that introduced the computerized C-V plotter in 1977. MDC has the technical support and applications experience to serve you better and a continuing commitment to pioneer semiconductor analysis technology.