MDC MERCURY PROBES may be connected to C-V plotters, computerized semiconductor measurement systems, curve tracers, or doping profilers for a variety of measurements. MERCURY PROBES eliminate time consuming metalization and their convenience make them ideal tools for production process monitoring applications. Their accuracy and reproducibility make them attractive for R&D applications. Possible applications include:

Doping Profiles of bulk or epitaxial layers

MOS characterization

Permittivity of Dielectrics

Detection of residual films on conducting substrates

Current-Voltage testing of Photovoltaic devices