Dynamically Controlled High Speed Digital I/O Card
Overview
The GT50-DIO is a high-speed dynamic digital I/O card. The GT50-DIO provides all the features of high-speed dynamic digital testers normally seen only in large functional test systems. The GT50-DIO may be combined with other PC instruments to form a mixed-signal test system
Features & Benefits
32 bi-directional I/O pins
Eight cards may be daisychained for a total of 256 pins
256 Kbit to 1 Mbit memory behind each pin
Programmable clock rates from 750 Hz to 50 MHz
Sequencer allows conditional branches, loops, and subroutines
Advanced features for UUT synchronization
Graphical programming of sequencer and vector generation
Available Models
Automatic Test Equipment (ATE)
High speed functional digital test
Digital pattern generator
Vector capture
Hybrid and digital device test
Memory testing
Event sequencer, logic pattern capture
