Dynamically Controlled, High Voltage Digital I/O PXI Card
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Overview
The GX5055 represents a new level of performance and capabilities for PXI-based digital instrumentation. Based on the proven architecture of the GX5050, the GX5055 offers high performance pin electronics and an enhanced timing generator in a compact, 6U PXI form factor.
Each card can function as a stand-alone digital subsystem or if required, multiple cards can be interconnected, providing a single domain and supporting up to 512 bi-directional channels.
Each digital channel can be individually programmed for a drive hi, drive lo, sense hi, sense lo, and a load value (with commutation voltage level) Ð offering the user complete flexibility when creating test programs and fixtures for multiple UUTs. In addition, each channel offers a parametric measurement unit (PMU)providing users with the capability to measure each UUT nodeÕs DC characteristic
Features & Benefits
Cycle based, dynamic digital instrument with per pin direction control
High performance pin electronics with per pin programmability
Per channel parametric mesurement unit (PMU)
Dual level drive / sense, and programmable load on a per channel basics
Adjustable slew rate from .1 to 1 V/ns
Wide drive / sense voltage range: -10 V to + 15 V
Per channel de-skew with sub-nanosecond resolution
Supports 6 data formats
50 MHz vector rate
32 bi-directional I/O pins (up to 18 cards may be daisy-chained for a total of 576 pins)
10 MB of on-board memory
External and programmable internal clock rates from 5 Hz to 50 MHz
Dynamically controlled sequencer uses opcodes and conditional logic for branching, looping, and subroutines
Available Models
Automatic Test Equipment (ATE)
High-speed functional digital test
Vector capture
Hybrid and digital device test
Memory testing
LRU and SRU tes
